{"id":6900,"date":"2026-04-24T14:58:33","date_gmt":"2026-04-24T07:58:33","guid":{"rendered":"https:\/\/www.advinno.com\/?p=6900"},"modified":"2026-04-24T18:26:16","modified_gmt":"2026-04-24T11:26:16","slug":"tessent-test-dft","status":"publish","type":"post","link":"https:\/\/www.advinno.com\/sg\/tessent-test-dft\/","title":{"rendered":"Tessent Test & DFT"},"content":{"rendered":"
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Tessent Test and DFT<\/h4>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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Tessent Silicon Lifecycle Management solutions deliver faster time to market by reducing design complexity using high-quality DFT. The solutions include advanced debug, safety and security features, and in-life data analytics to meet the evolving challenges of today’s silicon lifecycle from design through field operation.<\/p>

Tessent creates an infrastructure that makes designs more testable, achieving high-quality test, identifying defects and hidden yield limiters, and moving beyond test into system debug, validation, and in-life monitoring with embedded analytics and AI-powered insights.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t

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Key Tessent Solutions:<\/h4>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
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  • Advanced DFT for complex SoCs and chiplets<\/li>
  • Logic and memory test<\/li>
  • Embedded analytics for silicon insights<\/li>
  • Yield learning and recovery<\/li><\/ul><\/div><\/div><\/div><\/div><\/div><\/div>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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    • Safety and security automation<\/li>
    • Fault simulation for functional safety<\/li>
    • Silicon lifecycle management<\/li>
    • In-life monitoring and data analytics<\/li><\/ul><\/div><\/div><\/div><\/div><\/div><\/div>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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      Tessent Advanced DFT<\/span><\/h5><\/div><\/div>

      Address test challenges for complex SoCs and chiplets with market-leading logic and memory test products combining capabilities in a powerful test flow to ensure total chip coverage and high-quality test results.<\/p><\/div><\/div><\/div>

      • Market-leading logic and memory test<\/li>
      • Advanced DFT for complex SoCs and chiplets<\/li>
      • Total chip coverage assurance<\/li>
      • Powerful unified test flow<\/li><\/ul><\/div><\/div><\/div>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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        Tessent Embedded Analytics<\/span><\/h5><\/div><\/div>

        Close productivity gaps using actionable insights from embedded analytics that shorten development time, accelerate debug, and reduce risk and cost for timely market entry across the full silicon lifecycle.<\/p><\/div><\/div><\/div>

        • Actionable insights from embedded analytics<\/li>
        • Shortened development time<\/li>
        • Accelerated debug and validation<\/li>
        • Reduced risk and cost for market entry<\/li><\/ul><\/div><\/div><\/div>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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          Tessent Yield Learning<\/span><\/h5><\/div><\/div>

          Decrease time to yield, manage manufacturing excursions, and recover yield caused by systematic defects. Identify systematic defects that cause low yield, saving time and costs throughout the production lifecycle.<\/p><\/div><\/div><\/div>

          • Decreased time to yield<\/li>
          • Manufacturing excursion management<\/li>
          • Systematic defect identification<\/li>
          • Yield recovery from hidden limiters<\/li><\/ul><\/div><\/div><\/div>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
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            Tessent Safety and Security<\/span><\/h5><\/div><\/div>

            Access solutions that automate the application of safety and security technologies using Tessent, reducing risk and helping designs meet required standards and regulations for automotive, industrial, and safety-critical applications.<\/p><\/div><\/div><\/div>

            • Automated safety and security technology application<\/li>
            • Standards and regulations compliance<\/li>
            • Automotive and industrial safety support<\/li>
            • Reduced risk across the design lifecycle<\/li><\/ul><\/div><\/div><\/div>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t
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              <\/div>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"

              Tessent Test and DFT Tessent Silicon Lifecycle Management solutions deliver faster time to market by reducing design complexity using high-quality DFT. The solutions include advanced debug, safety and security features, and in-life data analytics to meet the evolving challenges of today’s silicon lifecycle from design through field operation. Tessent creates an infrastructure that makes designs […]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[1],"tags":[],"class_list":["post-6900","post","type-post","status-publish","format-standard","hentry","category-uncategorized"],"_links":{"self":[{"href":"https:\/\/www.advinno.com\/sg\/wp-json\/wp\/v2\/posts\/6900","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.advinno.com\/sg\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.advinno.com\/sg\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.advinno.com\/sg\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.advinno.com\/sg\/wp-json\/wp\/v2\/comments?post=6900"}],"version-history":[{"count":3,"href":"https:\/\/www.advinno.com\/sg\/wp-json\/wp\/v2\/posts\/6900\/revisions"}],"predecessor-version":[{"id":6989,"href":"https:\/\/www.advinno.com\/sg\/wp-json\/wp\/v2\/posts\/6900\/revisions\/6989"}],"wp:attachment":[{"href":"https:\/\/www.advinno.com\/sg\/wp-json\/wp\/v2\/media?parent=6900"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.advinno.com\/sg\/wp-json\/wp\/v2\/categories?post=6900"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.advinno.com\/sg\/wp-json\/wp\/v2\/tags?post=6900"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}